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On-Line Testing for VLSI

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Description

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. This text contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE international on-line testing workshops.
Release date NZ
April 30th, 1998
Audiences
  • Postgraduate, Research & Scholarly
  • Professional & Vocational
  • Undergraduate
Contributors
  • Edited by Dhiraj Pradhan
  • Edited by Michael Nicolaidis
  • Edited by Yervant Zorian
Edition
Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998
Illustrations
IV, 160 p.
Pages
160
Dimensions
178x254x11
ISBN-13
9780792381327
Product ID
2438102

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