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Frontiers in Electronic Testing

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Test Resource Partitioning for System-on-a-Chip by Anshuman Chandra
$290.00
Test Resource Partitioning for System-on-a-Chip
by Anshuman Chandra ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Testability Concepts for Digital ICs by A.P. Thijssen
$444.00
Testability Concepts for Digital ICs
by A.P. Thijssen ~ Paperback / softback
Available - Usually ships in 3-4 weeks
A Designer’s Guide to Built-In Self-Test on Hardback by Charles E. Stroud
$594.00
A Designer’s Guide to Built-In Self-Test
by Charles E. Stroud ~ Hardback
Available - Usually ships in 3-4 weeks
Verification by Error Modeling on Hardback by Katarzyna Radecka
$293.00
Verification by Error Modeling
by Katarzyna Radecka ~ Hardback
Available - Usually ships in 3-4 weeks
Delay Fault Testing for VLSI Circuits by Angela Krstic
$444.00
Delay Fault Testing for VLSI Circuits
by Angela Krstic ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Fault-Tolerance Techniques for SRAM-Based FPGAs by Ricardo Reis
$290.00
Fault-Tolerance Techniques for SRAM-Based FPGAs
by Ricardo Reis ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Formal Equivalence Checking and Design Debugging by Shi-Yu Huang
$521.00
Formal Equivalence Checking and Design Debugging
by Shi-Yu Huang ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Embedded Processor-Based Self-Test on Hardback by Dimitris Gizopoulos
$446.00
Embedded Processor-Based Self-Test
by Dimitris Gizopoulos ~ Hardback
Available - Usually ships in 3-4 weeks
From Contamination to Defects, Faults and Yield Loss by Jitendra B. Khare
$290.00
From Contamination to Defects, Faults and Yield Loss
by Jitendra B. Khare ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Fault-Tolerance Techniques for SRAM-Based FPGAs on Hardback by Ricardo Reis
$293.00
Fault-Tolerance Techniques for SRAM-Based FPGAs
by Ricardo Reis ~ Hardback
Available - Usually ships in 3-4 weeks
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits on Hardback by Manoj Sachdev
$578.00
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
by Manoj Sachdev ~ Hardback
Available - Usually ships in 3-4 weeks
Fault Diagnosis of Analog Integrated Circuits on Hardback by Prithviraj Kabisatpathy
$291.00
Fault Diagnosis of Analog Integrated Circuits
by Prithviraj Kabisatpathy ~ Hardback
Available - Usually ships in 3-4 weeks
On-Line Testing for VLSI on Hardback
$293.00
On-Line Testing for VLSI
Hardback
Available - Usually ships in 3-4 weeks
Elements of STIL on Hardback by Gregory A. Maston
$449.00
Elements of STIL
by Gregory A. Maston ~ Hardback
Available - Usually ships in 3-4 weeks
Emerging Nanotechnologies
$449.00
Emerging Nanotechnologies
Paperback / softback
Available - Usually ships in 3-4 weeks
Data Mining and Diagnosing IC Fails on Hardback by Leendert M Huisman
$294.00
Data Mining and Diagnosing IC Fails
by Leendert M Huisman ~ Hardback
Available - Usually ships in 3-4 weeks
Delay Fault Testing for VLSI Circuits on Hardback by Angela Krstic
$458.00
Delay Fault Testing for VLSI Circuits
by Angela Krstic ~ Hardback
Available - Usually ships in 3-4 weeks
Analog and Mixed-Signal Boundary-Scan on Hardback
$444.00
Analog and Mixed-Signal Boundary-Scan
Hardback
Available - Usually ships in 3-4 weeks
Research Perspectives and Case Studies in System Test and Diagnosis on Hardback
$460.00
Research Perspectives and Case Studies in System Test and Diagnosis
Hardback
Available - Usually ships in 3-4 weeks
From Contamination to Defects, Faults and Yield Loss on Hardback by Jitendra B. Khare
$302.00
From Contamination to Defects, Faults and Yield Loss
by Jitendra B. Khare ~ Hardback
Available - Usually ships in 3-4 weeks
Digital Timing Measurements on Hardback by Wolfgang Maichen
$447.00
Digital Timing Measurements
by Wolfgang Maichen ~ Hardback
Available - Usually ships in 3-4 weeks
Digital Timing Measurements by Wolfgang Maichen
$444.00
Digital Timing Measurements
by Wolfgang Maichen ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Test Resource Partitioning for System-on-a-Chip on Hardback by Anshuman Chandra
$307.00
Test Resource Partitioning for System-on-a-Chip
by Anshuman Chandra ~ Hardback
Available - Usually ships in 3-4 weeks
Verification by Error Modeling by Katarzyna Radecka
$290.00
Verification by Error Modeling
by Katarzyna Radecka ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Introduction to IDDQ Testing by S. Chakravarty
$293.00
Introduction to IDDQ Testing
by S. Chakravarty ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Analog and Mixed-Signal Boundary-Scan
$444.00
Analog and Mixed-Signal Boundary-Scan
Paperback / softback
Available - Usually ships in 3-4 weeks
Testing Static Random Access Memories by Said Hamdioui
$290.00
Testing Static Random Access Memories
by Said Hamdioui ~ Paperback / softback
Available - Usually ships in 3-4 weeks
A Designer’s Guide to Built-In Self-Test by Charles E. Stroud
$575.00
A Designer’s Guide to Built-In Self-Test
by Charles E. Stroud ~ Paperback / softback
Available - Usually ships in 3-4 weeks
The Core Test Wrapper Handbook on Hardback by Francisco Da Silva
$464.00
The Core Test Wrapper Handbook
by Francisco Da Silva ~ Hardback
Available - Usually ships in 3-4 weeks
Multi-Chip Module Test Strategies on Hardback
$294.00
Multi-Chip Module Test Strategies
Hardback
Available - Usually ships in 3-4 weeks
Emerging Nanotechnologies on Hardback
$452.00
Emerging Nanotechnologies
Hardback
Available - Usually ships in 3-4 weeks
Formal Equivalence Checking and Design Debugging on Hardback by Shi-Yu Huang
$537.00
Formal Equivalence Checking and Design Debugging
by Shi-Yu Huang ~ Hardback
Available - Usually ships in 3-4 weeks
Introduction to IDDQ Testing on Hardback by S. Chakravarty
$296.00
Introduction to IDDQ Testing
by S. Chakravarty ~ Hardback
Available - Usually ships in 3-4 weeks
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by Krishnendu Chakrabarty
$290.00
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
by Krishnendu Chakrabarty ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Design for AT-Speed Test, Diagnosis and Measurement
$446.00
Design for AT-Speed Test, Diagnosis and Measurement
Paperback / softback
Available - Usually ships in 3-4 weeks
Oscillation-Based Test in Mixed-Signal Circuits by Gloria Huertas Sanchez
$451.00
Oscillation-Based Test in Mixed-Signal Circuits
by Gloria Huertas Sanchez ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Research Perspectives and Case Studies in System Test and Diagnosis
$444.00
Research Perspectives and Case Studies in System Test and Diagnosis
Paperback / softback
Available - Usually ships in 3-4 weeks
Fault Diagnosis of Analog Integrated Circuits by Prithviraj Kabisatpathy
$290.00
Fault Diagnosis of Analog Integrated Circuits
by Prithviraj Kabisatpathy ~ Paperback / softback
Available - Usually ships in 3-4 weeks
Timing Performance of Nanometer Digital Circuits Under Process Variations on Hardback by Victor Champac
$344.00
Timing Performance of Nanometer Digital Circuits Under Process...
by Victor Champac ~ Hardback
Available - Usually ships in 3-4 weeks
Elements of STIL by Gregory A. Maston
$446.00
Elements of STIL
by Gregory A. Maston ~ Paperback / softback
Available - Usually ships in 3-4 weeks