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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs on Hardback by Robert Anholt
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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs

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Description

This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.
Release date NZ
November 30th, 1994
Author
Audiences
  • Postgraduate, Research & Scholarly
  • Professional & Vocational
Illustrations
black & white illustrations
Pages
324
Dimensions
152x229x22
ISBN-13
9780890067499
Product ID
5261552

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