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Defect Recognition and Image Processing in Semiconductors 1997 on Hardback by J. Doneker
Defect Recognition and Image Processing in Semiconductors 1997 on Hardback by J. Doneker
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Defect Recognition and Image Processing in Semiconductors 1997

Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997
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Description

This volume addresses: advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers and devices; the merits and limits of characterization techniques; standardization; correleations between defects and device formation performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques now available. It investigates defects in layers and devices, and examines the problems which have arisen in characterizing gallium nitride and silicon carbide.
Release date NZ
January 1st, 1998
Audiences
  • Postgraduate, Research & Scholarly
  • Professional & Vocational
  • Undergraduate
Pages
524
Dimensions
156x235x30
ISBN-13
9780750305006
Product ID
2422953

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