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Microscopy of Semiconducting Materials

1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK
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Description

This collection of papers provide an international forum for research professionals to discuss and disseminate their results. It focuses on the developments in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. Advances in the use of other microcharactisation techniques including scanning probe microscopy and X-ray topography and diffraction are also featured. The materials of interest cover the complete range of elemental and compound semiconductors.
Release date NZ
January 1st, 2000
Audiences
  • Postgraduate, Research & Scholarly
  • Professional & Vocational
Contributors
  • Edited by A G Cullis
  • Edited by R Beanland
Pages
772
Dimensions
156x235x41
ISBN-13
9780750306508
Product ID
2541162

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