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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies by Andrei Pavlov
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies by Andrei Pavlov
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test
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Description

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Author Biography:

Prof. Sachdev has authored several successful books with Springer
Release date NZ
October 28th, 2010
Audience
  • Professional & Vocational
Edition
Softcover reprint of hardcover 1st ed. 2008
Illustrations
XVI, 194 p.
Pages
194
Dimensions
156x234x11
ISBN-13
9789048178551
Product ID
9980066

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