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VLSI Design and Test
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VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
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Description

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Release date NZ
December 10th, 2013
Audience
  • Professional & Vocational
Contributors
  • Edited by Adit Singh
  • Edited by D. Boolchandani
  • Edited by Manoj Singh Gaur
  • Edited by Mark Zwolinski
  • Edited by Vijay Laxmi
  • Edited by Virendra Sing
Illustrations
246 Illustrations, black and white; XVI, 388 p. 246 illus.
Pages
388
Dimensions
155x235x21
ISBN-13
9783642420238
Product ID
21778917

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