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Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
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Description

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.
Release date NZ
August 4th, 2014
Audience
  • Professional & Vocational
Contributors
  • Edited by Francisco Escolano
  • Edited by Gavin Brown
  • Edited by Marcello Pelillo
  • Edited by Marco Loog
  • Edited by Pasi Franti
Illustrations
124 Illustrations, black and white; XX, 478 p. 124 illus.
Pages
478
Dimensions
155x235x26
ISBN-13
9783662444146
Product ID
22609574

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