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Resonant X-Ray Scattering in Correlated Systems on Hardback
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Resonant X-Ray Scattering in Correlated Systems

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Description

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Author Biography:

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan. Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.
Release date NZ
January 5th, 2017
Contributors
  • Edited by Sumio Ishihara
  • Edited by Youichi Murakami
Pages
241
Edition
1st ed. 2017
Audience
  • Professional & Vocational
Illustrations
25 Illustrations, color; 126 Illustrations, black and white; VII, 241 p. 151 illus., 25 illus. in color.
Dimensions
155x235x16
ISBN-13
9783662532256
Product ID
25635222

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