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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices on Hardback
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

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Description

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide- semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Release date NZ
August 3rd, 2004
Audience
  • Professional & Vocational
Contributors
  • Edited by Daniel M. Fleetwood
  • Edited by Ronald D. Schrimpf
Pages
348
Dimensions
168x249x23
ISBN-13
9789812389404
Product ID
25081057

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