Non-Fiction Books:

Electrothermal Analysis of VLSI Systems

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Description

This text addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. This work should be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
Release date NZ
June 30th, 2000
Audiences
  • Postgraduate, Research & Scholarly
  • Professional & Vocational
  • Undergraduate
Illustrations
36 Illustrations, black and white; XXIII, 210 p. 36 illus.
Pages
210
Dimensions
156x234x14
ISBN-13
9780792378617
Product ID
2795834

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