Digital Noise Monitoring of Defect Origin

By:

Telman Aliev

Format:

Paperback / softback

Series:

Lecture Notes in Electrical Engineering

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Description

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Release date NZ

November 24th, 2010

Author

Telman Aliev

Audience

Professional & Vocational

Edition

Softcover reprint of hardcover 1st ed. 2007

Illustrations

XII, 224 p.

Pages

224

Series

Lecture Notes in Electrical Engineering

Dimensions

156x234x12

ISBN-13

9781441944108

Product ID

11082331

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