Design Techniques for Mash Continuous-Time Delta-Sigma Modulators

Name: Design Techniques for Mash Continuous-Time Delta-Sigma Modulators
SKU: 27599840
Price: 295.00 NZD
Availability: InStock

By:

Format:

Hardback

Show Hide Adult Content

$295.00

Available from supplier

Usually ships in 3-4 weeks

0 in Trolley

Price Match

Free Delivery with Primate

Join Now

Free 14 day free trial, cancel anytime.

Buy Now, Pay Later with:

4 payments of $73.75 with Afterpay Learn more

6 weekly interest-free payments of $49.17 with Laybuy Learn more

Availability

Delivering to:

Estimated arrival:

Around 11-21 June using International Courier

Description

This book describes a circuit architecture for converting real analog signals into a digital format, suitable for digital signal processors. This architecture, referred to as multi-stage noise-shaping (MASH) Continuous-Time Sigma-Delta Modulators (CT-ΔΣM), has the potential to provide better digital data quality and achieve better data rate conversion with lower power consumption. The authors not only cover MASH continuous-time sigma delta modulator fundamentals, but also provide a literature review that will allow students, professors, and professionals to catch up on the latest developments in related technology.

Author Biography:

Qiyuan Liu is a Senior Engineer at Qualcomm.Alexander Edward is a Senior Engineer at Intel. Carlos Briseno-Vidrios is a Senior Engineer at Silicon Labs. Jose Silva-Martinez got his PhD degree from the Katholieke Universiteit Leuven, Belgium in 1992. He currently holds the rank of Texas Instruments Professor in Analog Engineering at the Department of ECE, Texas A&M University. Dr. Silva-Martinez is an IEEE-Fellow and member of the 2013-2014 CASS Distinguish Lecture Program. His record of publications show over 100 journals and 160 conferences, 2 books and 12 book chapters and 1 patent. He is co-author of the papers that received the 2011 Best Student Paper Award, IEEE MWCAS, the 2003 Best Student Paper Award, IEEE RF-IC, and recipient of the 1990 Best Paper Award, European Solid-State Circuits Conference (ESSCIRC). He got the 2005 Outstanding Professor Award by the ECE Department, Texas A&M University, 2005; co-Advised in Testing techniques the student who was Winner ofthe 2005 Best Doctoral Thesis Award, presented by the IEEE Test Technology Technical Council (TTTC), IEEE Computer Society.

Release date NZ

April 11th, 2018

Author

Audience

Professional & Vocational

Edition

1st ed. 2018

Illustrations

71 Illustrations, color; 113 Illustrations, black and white; XVI, 208 p. 184 illus., 71 illus. in color.

Pages

208

ISBN-13

9783319772240

Product ID

27599840

Customer reviews

Nobody has reviewed this product yet. You could be the first!

Write a Review

Marketplace listings

There are no Marketplace listings available for this product currently.
Already own it? Create a free listing and pay just 9% commission when it sells!

Sell Yours Here