Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Name: Built-in-Self-Test and Digital Self-Calibration for RF SoCs
SKU: 10357671
Price: 148.00 NZD
Availability: InStock

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Format:

Paperback / softback

Series:

Springerbriefs in Electrical and Computer Engineering

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Description

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

Release date NZ

September 22nd, 2011

Author

Audience

Postgraduate, Research & Scholarly

Illustrations

70 Illustrations, black and white; XVII, 89 p. 70 illus.

Pages

Series

Springerbriefs in Electrical and Computer Engineering

Dimensions

156x234x5

ISBN-13

9781441995476

Product ID

10357671

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