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Advances in Imaging and Electron Physics: Volume 157 on Hardback
Advances in Imaging and Electron Physics: Volume 157 on Hardback
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Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers
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Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Author Biography:

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.
Release date NZ
November 3rd, 2009
Audience
  • Professional & Vocational
Contributor
  • Series edited by Peter W. Hawkes
Pages
373
Dimensions
152x229x32
ISBN-13
9780123747686
Product ID
3227554

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