Excerpt from Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability The transmission/reflection and short-circuit line methods for measuring complex permit tivity and permeability of materials in waveguides and coaxial lines are examined. Equa tions for complex permittivity and permeability are developed from first principles. In addition, new formulations for the determination of complex permittivity and permeabil ity independent of reference plane position are derived. For the one-sample transmis sion/reflection method and two-position short-circuit line measurements, the solutions are unstable at frequencies corresponding to integral multiples of one-half wavelength in the sample. For two-sample methods the solutions are unstable for frequencies where both samples resonate simultaneously. Criteria are given for sample lengths to maintain stabil ity. An optimized solution is also presented for the scattering parameters. This solution is stable over all frequencies and is capable of reducing scattering parameter data on ma terials with higher dielectric constant. An uncertainty analysis for the various techniques is developed and the results are compared. The errors incurred due to the uncertainty in scattering parameters, length measurement, and reference plane position are used as inputs to the uncertainty models. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.