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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by Martin Schmidbauer
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by Martin Schmidbauer
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

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Description

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Release date NZ
December 1st, 2010
Audience
  • Professional & Vocational
Edition
Softcover reprint of hardcover 1st ed. 2004
Illustrations
X, 204 p.
Pages
204
Dimensions
156x234x11
ISBN-13
9783642057694
Product ID
8962844

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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures on Hardback by Martin Schmidbauer
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