Random Telegraph Signals in Semiconductor Devices

Name: Random Telegraph Signals in Semiconductor Devices
SKU: 26194380
Price: 423.00 NZD
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Hardback

Series:

IOP Expanding Physics

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Description

Following their first observation in 1984, random telegraph signals (RTS) were initially a purely scientific tool to study fundamental aspects of defects in semiconductor devices. As semiconductor devices move to the nanoscale however, RTS have become an issue of major concern to the semiconductor industry, both in the development of current technology, such as memory devices and logic circuits, as well as in future semiconductor devices beyond the silicon roadmap, such as nanowire, TFET and carbon nanotube-based devices. It has become clear that the reliability of state-of-the-art and future CMOS technology nodes is dominated by RTS and single-trap phenomena, and so its understanding is of vital importance for the modelling and simulation of the operation and the expected lifetime of CMOS devices and circuits. It is the aim of this book to provide a comprehensive and up-to-date review of one of the most challenging issues facing the semiconductor industry, from the fundamentals of RTS to applied technology.

Author Biography:

Eddy Simoen is Senior Researcher at imec and Professor at Ghent University, Belgium. Cor Claeys is Director of Advanced Semiconductor Technologies at imec, and Professor at KU Leuven, Belgium.

Release date NZ

November 1st, 2016

Author

Audience

Professional & Vocational

Illustrations

With figures in colour and in black and white

Pages

216

Series

IOP Expanding Physics

Dimensions

185x266x18

ISBN-13

9780750312738

Product ID

26194380

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