An updated version of the 1994 text, "Physical Methods for Materials Characterization", this book provides a description of the large range of techniques in use for the characterization of the microstructure of materials. The characterization techniques covered include optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. This book is suitable as a textbook, but it also acts as a guide for inexperienced researchers who need to learn the best way to use a specific technique for any given group of materials.
Table of Contents
Introduction. Interaction of Radiation with Materials. Vacuum Systems. Diffraction. Photo/Electromagnetic Sources. Electron Sources. Atom and Ion Sources. Application of Computers.