Non-Fiction Books:

Modern Interferometry for Length Metrology

Exploring Limits and Novel Techniques



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Modern Interferometry for Length Metrology

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Modern Interferometry for Length Metrology: Exploring Limits and Novel Techniques gives an overview of refined traditional methods and novel techniques in the fields of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units requires a measurement principle which establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and describes innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data and novel techniques enabling them to better apply and understand interferometry and length metrology.

Author Biography

Dr. Rene Sch del is the head of The Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB) and is highly engaged in fields of optical interferometry and length metrology. Contributors to the work are, Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr. Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Prof. Seung-Woo Kim, Dr. Yoon-Soo Jang, Prof. Armin Reichhold, Dr. Birk Andreas and Dr. Christoph Weichert.
Release date NZ
December 31st, 2018
Contributions by Armin Reichhold Contributions by Arnold Nicolaus Contributions by Florian Pollinger Contributions by Guido Bartl Contributions by Nandini Bhattacharya Contributions by Seung-Woo Kim Contributions by Steven van den Berg Contributions by Thilo Schuldt Contributions by Yoon-Soo Jang Edited by Rene Schoedel
Country of Publication
United Kingdom
With figures in colour and in black and white
Institute of Physics Publishing
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