Integrated Circuit Failure Analysis

A Guide to Preparation Techniques

By:

Friedrich Beck

Format:

Hardback

Series:

Quality and Reliability Engineering Series

Show Hide Adult Content

$574.00

Available from supplier

Usually ships in 3-4 weeks

0 in Trolley

Price Match

Wrap this item as a gift ($5.90) - add a free gift card on the next page

Free Delivery with Primate

Join Now

Free 14 day free trial, cancel anytime.

Buy Now, Pay Later with:

4 payments of $143.50 with Afterpay Learn more

6 weekly interest-free payments of $95.67 with Laybuy Learn more

Availability

Delivering to:

Estimated arrival:

Around 30 May - 11 Jun using International Courier

Description

The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right. The circuit designer must constantly expand the range of analytical and preparative methods, adapting them to the needs of new technologies in order to successfully locate faults and ensure optimum quality.

Author Biography:

Friedrich Beck is the author of Integrated Circuit Failure Analysis: A Guide to Preparation Techniques, published by Wiley.

Release date NZ

January 19th, 1998

Author

Friedrich Beck

Audiences

Postgraduate, Research & Scholarly
Professional & Vocational
Technical / Manuals
Undergraduate

Pages

190

Series

Quality and Reliability Engineering Series

Dimensions

155x235x15

ISBN-13

9780471974017

Product ID

3076901

Customer reviews

Nobody has reviewed this product yet. You could be the first!

Write a Review

Marketplace listings

There are no Marketplace listings available for this product currently.
Already own it? Create a free listing and pay just 9% commission when it sells!

Sell Yours Here