Non-Fiction Books:

Characterization of Semiconductor Materials, Volume 1: Volume 1

Principles and Methods

Format

Hardback

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Characterization of Semiconductor Materials, Volume 1: Volume 1 by Gary F. McGuire
$173.99
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Description

Characterization of semiconductor materials and methods used to characterize them are described extensively in this book. Contents include: Electrical Characterization of Semiconductor Materials and Devices Secondary Ion Mass Spectrometry Photoelectron Spectroscopy Application to Semiconductors Ion/Solid Interactions in Surface Analysis Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy.
Release date NZ
December 31st, 1989
Country of Publication
United States
Imprint
William Andrew Publishing
Pages
342
Dimensions
156x234x20
ISBN-13
9780815512004
Product ID
3084664

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