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Characterization of Semiconductor Materials, Volume 1: Volume 1 on Hardback by Gary F. McGuire
Characterization of Semiconductor Materials, Volume 1: Volume 1 on Hardback by Gary F. McGuire
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Characterization of Semiconductor Materials, Volume 1: Volume 1

Principles and Methods
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Description

Characterization of semiconductor materials and methods used to characterize them are described extensively in this book. Contents include: Electrical Characterization of Semiconductor Materials and Devices Secondary Ion Mass Spectrometry Photoelectron Spectroscopy Application to Semiconductors Ion/Solid Interactions in Surface Analysis Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy.
Release date NZ
December 31st, 1989
Audience
  • Professional & Vocational
Country of Publication
United States
Imprint
William Andrew Publishing
Pages
342
Publisher
William Andrew Publishing
Dimensions
156x234x20
ISBN-13
9780815512004
Product ID
3084664

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