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Bias Temperature Instability for Devices and Circuits on Hardback
Bias Temperature Instability for Devices and Circuits on Hardback
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Bias Temperature Instability for Devices and Circuits

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Hardback
$464.00
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Description

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Release date NZ
October 23rd, 2013
Audience
  • Professional & Vocational
Contributor
  • Edited by Tibor Grasser
Illustrations
318 Illustrations, color; 283 Illustrations, black and white; XI, 810 p. 601 illus., 318 illus. in color.
Pages
810
Dimensions
155x235x41
ISBN-13
9781461479086
Product ID
21380961

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