Analog IC Reliability in Nanometer CMOS

Name: Analog IC Reliability in Nanometer CMOS
SKU: 23357354
Price: 293.00 NZD
Availability: InStock

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Paperback / softback

Series:

Analog Circuits and Signal Processing

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Description

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

Release date NZ

June 19th, 2015

Author

Audience

Professional & Vocational

Illustrations

XVI, 198 p.

Pages

198

Series

Analog Circuits and Signal Processing

Dimensions

155x235x12

ISBN-13

9781489986306

Product ID

23357354

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